BibTeX record conf/itc/ShangSKHK21

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@inproceedings{DBLP:conf/itc/ShangSKHK21,
  author       = {Yang Shang and
                  Makoto Shinohara and
                  Eiji Kato and
                  Masaichi Hashimoto and
                  Joanna Kiljan},
  title        = {Open-short Normalization Method for a Quick Defect Identification
                  in Branched Traces with High-resolution Time-domain Reflectometry},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
                  October 10-15, 2021},
  pages        = {233--242},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ITC50571.2021.00032},
  doi          = {10.1109/ITC50571.2021.00032},
  timestamp    = {Mon, 29 Nov 2021 13:31:58 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ShangSKHK21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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