BibTeX record conf/itc/SeguraBRH95

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@inproceedings{DBLP:conf/itc/SeguraBRH95,
  author       = {Jaume Segura and
                  Carol de Benito and
                  Antonio Rubio and
                  Charles F. Hawkins},
  title        = {A Detailed Analysis of {GOS} Defects in {MOS} Transistors: Testing
                  Implications at Circuit Level},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {544--551},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529882},
  doi          = {10.1109/TEST.1995.529882},
  timestamp    = {Mon, 10 Jul 2023 07:56:37 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/SeguraBRH95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}