BibTeX
@inproceedings{DBLP:conf/itc/SchuermyerBCMDN03,
author = {Chris Schuermyer and
Brady Benware and
Kevin Cota and
Robert Madge and
W. Robert Daasch and
L. Ning},
title = {Screening VDSM Outliers using Nominal and Subthreshold Supply
Voltage IDDQ},
booktitle = {ITC},
year = {2003},
pages = {565-573},
ee = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630565abs.htm},
crossref = {DBLP:conf/itc/2003},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/2003,
title = {Proceedings 2003 International Test Conference (ITC 2003),
Breaking Test Interface Bottlenecks, 28 September - 3 October
2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
year = {2003},
isbn = {0-7803-8106-8},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2004-07-06 by Michael Ley (ley@uni-trier.de)