BibTeX record conf/itc/SchromHMVKF19

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@inproceedings{DBLP:conf/itc/SchromHMVKF19,
  author       = {Gerhard Schrom and
                  Michael J. Hill and
                  Sarath Makala and
                  Ravi Sankar Vunnam and
                  Arun Krishnamoorthy and
                  Ryan Ferguson},
  title        = {Efficiency Measurement Method for Fully Integrated Voltage Regulators
                  used in 4\({}^{\mbox{th}}\) and 5\({}^{\mbox{th}}\) Generation Intel{\textregistered}
                  Core{\texttrademark} Microprocessors},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000125},
  doi          = {10.1109/ITC44170.2019.9000125},
  timestamp    = {Thu, 14 Oct 2021 09:45:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/SchromHMVKF19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}