BibTeX record: conf/itc/SchneiderS08

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@inproceedings{DBLP:conf/itc/SchneiderS08,
  author    = {Myron Schneider and
               Ayub Shafi},
  title     = {Engineering Test Coverage on Complex Sockets},
  booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
               California, USA, October 26-31, 2008},
  year      = {2008},
  pages     = {1--9},
  crossref  = {DBLP:conf/itc/2008},
  url       = {http://dx.doi.org/10.1109/TEST.2008.4700578},
  doi       = {10.1109/TEST.2008.4700578},
  timestamp = {Mon, 22 Sep 2014 18:30:05 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/SchneiderS08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/2008,
  editor    = {Douglas Young and
               Nur A. Touba},
  title     = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
               California, USA, October 26-31, 2008},
  year      = {2008},
  publisher = {{IEEE}},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4690905},
  isbn      = {978-1-4244-2403-0},
  timestamp = {Mon, 22 Sep 2014 18:30:05 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/2008},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}