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BibTeX record conf/itc/SchlangenLKBJMWLK07
@inproceedings{DBLP:conf/itc/SchlangenLKBJMWLK07, author = {Rudolf Schlangen and Reiner Leihkauf and Uwe Kerst and Christian Boit and Rajesh Jain and Tahir Malik and Keneth R. Wilsher and Ted R. Lundquist and Bernd Kr{\"{u}}ger}, editor = {Jill Sibert and Janusz Rajski}, title = {Backside E-Beam Probing on Nano scale devices}, booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara, California, USA, October 21-26, 2007}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/TEST.2007.4437627}, doi = {10.1109/TEST.2007.4437627}, timestamp = {Thu, 23 Mar 2023 23:58:38 +0100}, biburl = {https://dblp.org/rec/conf/itc/SchlangenLKBJMWLK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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