BibTeX record conf/itc/SchlangenLKBJMWLK07

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@inproceedings{DBLP:conf/itc/SchlangenLKBJMWLK07,
  author       = {Rudolf Schlangen and
                  Reiner Leihkauf and
                  Uwe Kerst and
                  Christian Boit and
                  Rajesh Jain and
                  Tahir Malik and
                  Keneth R. Wilsher and
                  Ted R. Lundquist and
                  Bernd Kr{\"{u}}ger},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Backside E-Beam Probing on Nano scale devices},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437627},
  doi          = {10.1109/TEST.2007.4437627},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SchlangenLKBJMWLK07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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