SaxenaBGRKBCB02'

@inproceedings{DBLP:conf/itc/SaxenaBGRKBCB02,
  author    = {Jayashree Saxena and
               Kenneth M. Butler and
               John Gatt and
               R. Raghuraman and
               Sudheendra Phani Kumar and
               Supatra Basu and
               David J. Campbell and
               John Berech},
  title     = {Scan-Based Transition Fault Testing - Implementation and
               Low Cost Test Challenges },
  booktitle = {ITC},
  year      = {2002},
  pages     = {1120-1129},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041869},
  crossref  = {DBLP:conf/itc/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2002,
  title     = {Proceedings IEEE International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  publisher = {IEEE Computer Society},
  year      = {2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}