DBLP BibTeX Record 'conf/itc/SavirMV85'

@inproceedings{DBLP:conf/itc/SavirMV85,
  author    = {Jacob Savir and
               William H. McAnney and
               Salvatore R. Vecchio},
  title     = {Random Pattern Testing for Data-Line Faults in an Embedded
               Multiport Memory},
  booktitle = {ITC},
  year      = {1985},
  pages     = {100-105},
  crossref  = {DBLP:conf/itc/1985},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1985,
  title     = {Proceedings International Test Conference 1985, Philadelphia,
               PA, USA, November 1985},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1985},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}