BibTeX record: conf/itc/SavirMV85

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@inproceedings{DBLP:conf/itc/SavirMV85,
  author    = {Jacob Savir and
               William H. McAnney and
               Salvatore R. Vecchio},
  title     = {Random Pattern Testing for Data-Line Faults in an Embedded Multiport
               Memory},
  booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
               USA, November 1985},
  year      = {1985},
  pages     = {100--105},
  crossref  = {DBLP:conf/itc/1985},
  timestamp = {Sat, 25 Oct 2014 12:16:53 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/SavirMV85},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/1985,
  title     = {Proceedings International Test Conference 1985, Philadelphia, PA,
               USA, November 1985},
  year      = {1985},
  publisher = {{IEEE} Computer Society},
  timestamp = {Sat, 25 Oct 2014 12:16:53 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/1985},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}