BibTeX record conf/itc/Savir90

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@inproceedings{DBLP:conf/itc/Savir90,
  author       = {Jacob Savir},
  title        = {{AC} product defect level and yield loss},
  booktitle    = {Proceedings {IEEE} International Test Conference 1990, Washington,
                  D.C., USA, September 10-14, 1990},
  pages        = {726--738},
  publisher    = {{IEEE} Computer Society},
  year         = {1990},
  url          = {https://doi.org/10.1109/TEST.1990.114089},
  doi          = {10.1109/TEST.1990.114089},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Savir90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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