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BibTeX record conf/itc/SatoIOIWNZKYKH021
@inproceedings{DBLP:conf/itc/SatoIOIWNZKYKH021, author = {Keno Sato and Takashi Ishida and Toshiyuki Okamoto and Tamotsu Ichikawa and Jianglin Wei and Takayuki Nakatani and Yujie Zhao and Shogo Katayama and Shuhei Yamamoto and Anna Kuwana and Kazumi Hatayama and Haruo Kobayashi}, title = {Revisit to Accurate {ADC} Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies}, booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA, October 10-15, 2021}, pages = {284--288}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/ITC50571.2021.00038}, doi = {10.1109/ITC50571.2021.00038}, timestamp = {Mon, 21 Mar 2022 15:41:16 +0100}, biburl = {https://dblp.org/rec/conf/itc/SatoIOIWNZKYKH021.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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