dblp.uni-trier.dewww.uni-trier.de

DBLP Record 'conf/itc/SashoS96'

BibTeX

@inproceedings{DBLP:conf/itc/SashoS96,
  author    = {Seiji Sasho and
               Teruhisa Sakata},
  title     = {Four Multi Probing Test for 16 Bit DAC with Vertical Contact
               Probe Card},
  booktitle = {ITC},
  year      = {1996},
  pages     = {86-91},
  crossref  = {DBLP:conf/itc/1996},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1996,
  title     = {Proceedings IEEE International Test Conference 1996, Test
               and Design Validity, Washington, DC, USA, October 20-25,
               1996},
  publisher = {IEEE Computer Society},
  year      = {1996},
  isbn      = {0-7803-3541-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2002-03-18 by Michael Ley (ley@uni-trier.de)