BibTeX
@inproceedings{DBLP:conf/itc/SashoS96,
author = {Seiji Sasho and
Teruhisa Sakata},
title = {Four Multi Probing Test for 16 Bit DAC with Vertical Contact
Probe Card},
booktitle = {ITC},
year = {1996},
pages = {86-91},
crossref = {DBLP:conf/itc/1996},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1996,
title = {Proceedings IEEE International Test Conference 1996, Test
and Design Validity, Washington, DC, USA, October 20-25,
1996},
publisher = {IEEE Computer Society},
year = {1996},
isbn = {0-7803-3541-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2002-03-18 by Michael Ley (ley@uni-trier.de)