BibTeX record conf/itc/Sanchez-Martinez20

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@inproceedings{DBLP:conf/itc/Sanchez-Martinez20,
  author       = {Cesar A. S{\'{a}}nchez{-}Mart{\'{\i}}nez and
                  Paulo L{\'{o}}pez{-}Meyer and
                  Esdras Ju{\'{a}}rez{-}Hern{\'{a}}ndez and
                  Aaron Desiga{-}Orenday and
                  Andr{\'{e}}s Viveros{-}Wacher},
  title        = {High Speed Serial Links Risk Assessment in Industrial Post-Silicon
                  Validation Exploiting Machine Learning Techniques},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325238},
  doi          = {10.1109/ITC44778.2020.9325238},
  timestamp    = {Mon, 25 Jan 2021 09:58:51 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Sanchez-Martinez20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}