@inproceedings{DBLP:conf/itc/RighterSB96,
author = {Alan W. Righter and
Jerry M. Soden and
Richard W. Beegle},
title = {High Resolution I$_{\mbox{DDQ}}$ Characterization and Testing
- Practical Issues},
booktitle = {ITC},
year = {1996},
pages = {259-268},
ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.1996.556970},
crossref = {DBLP:conf/itc/1996},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1996,
title = {Proceedings IEEE International Test Conference 1996, Test
and Design Validity, Washington, DC, USA, October 20-25,
1996},
publisher = {IEEE Computer Society},
year = {1996},
isbn = {0-7803-3541-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}