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BibTeX record conf/itc/Rhines16
@inproceedings{DBLP:conf/itc/Rhines16, author = {Walden C. Rhines}, title = {Plenary keynote address Tuesday: The business of test: Test and semiconductor economics}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805816}, doi = {10.1109/TEST.2016.7805816}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/Rhines16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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