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BibTeX record conf/itc/RemmersLF05
@inproceedings{DBLP:conf/itc/RemmersLF05, author = {Jeff Remmers and Darin Lee and Richard Fisette}, title = {Hierarchical {DFT} with enhancements for {AC} scan, test scheduling and on-chip compression - a case study}, booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005, Austin, TX, USA, November 8-10, 2005}, pages = {9}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/TEST.2005.1584034}, doi = {10.1109/TEST.2005.1584034}, timestamp = {Thu, 23 Mar 2023 23:58:38 +0100}, biburl = {https://dblp.org/rec/conf/itc/RemmersLF05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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