BibTeX record conf/itc/RaymondHBRM94

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@inproceedings{DBLP:conf/itc/RaymondHBRM94,
  author       = {Douglas W. Raymond and
                  Dominic F. Haigh and
                  Ray Bodick and
                  Barbara Ryan and
                  Dale McCombs},
  title        = {Non-Volatile Programmable Devices and In-Circuit Test},
  booktitle    = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
                  Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages        = {817--823},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/TEST.1994.528029},
  doi          = {10.1109/TEST.1994.528029},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/RaymondHBRM94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}