@inproceedings{DBLP:conf/itc/RaymondHBRM94,
  author    = {Douglas W. Raymond and
               Dominic F. Haigh and
               Ray Bodick and
               Barbara Ryan and
               Dale McCombs},
  title     = {Non-Volatile Programmable Devices and In-Circuit Test},
  booktitle = {ITC},
  year      = {1994},
  pages     = {817-823},
  ee        = {http://dx.doi.org/10.1109/TEST.1994.528029},
  crossref  = {DBLP:conf/itc/1994},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1994,
  title     = {Proceedings IEEE International Test Conference 1994, TEST:
               The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  publisher = {IEEE Computer Society},
  year      = {1994},
  isbn      = {0-7803-2103-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}