BibTeX record conf/itc/RamanLMNY20

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@inproceedings{DBLP:conf/itc/RamanLMNY20,
  author       = {Srikanth Venkataraman and
                  Pongpachara Limpisathian and
                  Pascal Meinerzhagen and
                  Suriyaprakash Natarajan and
                  Eric Yang},
  title        = {Automating Design For Yield: Silicon Learning to Predictive Models
                  and Design Optimization},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325263},
  doi          = {10.1109/ITC44778.2020.9325263},
  timestamp    = {Mon, 13 Jun 2022 18:49:36 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/RamanLMNY20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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