DBLP Record 'conf/itc/RainaNM97'

BibTeX

@inproceedings{DBLP:conf/itc/RainaNM97,
  author    = {Rajesh Raina and
               Charles Njinda and
               Robert F. Molyneaux},
  title     = {How Seriously Do You Take Your Possible-Detect Faults?},
  booktitle = {ITC},
  year      = {1997},
  pages     = {819-828},
  crossref  = {DBLP:conf/itc/1997},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1997,
  title     = {Proceedings IEEE International Test Conference 1997, Washington,
               DC, USA, November 3-5, 1997},
  publisher = {IEEE Computer Society},
  year      = {1997},
  isbn      = {0-7803-4209-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}