BibTeX record conf/itc/QuachH97

download as .bib file

@inproceedings{DBLP:conf/itc/QuachH97,
  author       = {Minh Quach and
                  Kim Harper},
  title        = {Real-Time In-situ Monitoring and Characterization of Production Wafer
                  Probing Process},
  booktitle    = {Proceedings {IEEE} International Test Conference 1997, Washington,
                  DC, USA, November 3-5, 1997},
  pages        = {802--808},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/TEST.1997.639694},
  doi          = {10.1109/TEST.1997.639694},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/QuachH97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}