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BibTeX record conf/itc/QuachH97
@inproceedings{DBLP:conf/itc/QuachH97, author = {Minh Quach and Kim Harper}, title = {Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process}, booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington, DC, USA, November 3-5, 1997}, pages = {802--808}, publisher = {{IEEE} Computer Society}, year = {1997}, url = {https://doi.org/10.1109/TEST.1997.639694}, doi = {10.1109/TEST.1997.639694}, timestamp = {Thu, 23 Mar 2023 23:58:38 +0100}, biburl = {https://dblp.org/rec/conf/itc/QuachH97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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