BibTeX
@inproceedings{DBLP:conf/itc/PortalFAN02,
author = {Jean Michel Portal and
L. Forli and
Hassen Aziza and
Didier N{\'e}e},
title = {An Automated Methodology to Diagnose Geometric Defect in
the EEPROM Cell},
booktitle = {ITC},
year = {2002},
pages = {31-36},
ee = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430031abs.htm},
crossref = {DBLP:conf/itc/2002},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/2002,
title = {Proceedings IEEE International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
year = {2002},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-07-05 by Michael Ley (ley@uni-trier.de)