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BibTeX record conf/itc/PomeranzR01a
@inproceedings{DBLP:conf/itc/PomeranzR01a, author = {Irith Pomeranz and Sudhakar M. Reddy}, title = {On improving the stuck-at fault coverage of functional test sequences by using limited-scan operations}, booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001}, pages = {211--220}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/TEST.2001.966636}, doi = {10.1109/TEST.2001.966636}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/PomeranzR01a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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