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BibTeX record conf/itc/Pomeranz19
@inproceedings{DBLP:conf/itc/Pomeranz19, author = {Irith Pomeranz}, title = {Iterative Test Generation for Gate-Exhaustive Faults to Cover the Sites of Undetectable Target Faults}, booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC, USA, November 9-15, 2019}, pages = {1--7}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ITC44170.2019.9000124}, doi = {10.1109/ITC44170.2019.9000124}, timestamp = {Mon, 24 Feb 2020 17:28:46 +0100}, biburl = {https://dblp.org/rec/conf/itc/Pomeranz19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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