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BibTeX record conf/itc/Pomeranz03
@inproceedings{DBLP:conf/itc/Pomeranz03, author = {Irith Pomeranz}, title = {Reducing Test Data Volume Using Random-Testable and Periodic-Testable Scan Chains in Circuits with Multiple Scan Chains}, booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, {USA}}, pages = {441--450}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/TEST.2003.1270869}, doi = {10.1109/TEST.2003.1270869}, timestamp = {Thu, 23 Mar 2023 23:58:38 +0100}, biburl = {https://dblp.org/rec/conf/itc/Pomeranz03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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