@inproceedings{DBLP:conf/itc/PlusquellicGHSC00,
  author    = {James F. Plusquellic and
               Amy Germida and
               Jonathan Hudson and
               Ernesto Staroswiecki and
               Chintan Patel},
  title     = {Predicting device performance from pass/fail transient signal
               analysis data},
  booktitle = {ITC},
  year      = {2000},
  pages     = {1070-1079},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894320},
  crossref  = {DBLP:conf/itc/2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2000,
  title     = {Proceedings IEEE International Test Conference 2000, Atlantic
               City, NJ, USA, October 2000},
  publisher = {IEEE Computer Society},
  year      = {2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}