Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data.

James F. Plusquellic Donald M. Chiarulli Steven P. Levitan Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data. 40-49 1997 conf/itc/1997 ITC db/conf/itc/itc1997.html#PlusquellicCL97