DBLP BibTeX Record 'conf/itc/PatilS92'

@inproceedings{DBLP:conf/itc/PatilS92,
  author    = {Srinivas Patil and
               Jacob Savir},
  title     = {Skewed-Load Transition Test: Part 2, Coverage},
  booktitle = {ITC},
  year      = {1992},
  pages     = {714-722},
  ee        = {http://dx.doi.org/10.1109/TEST.1992.527893},
  crossref  = {DBLP:conf/itc/1992},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1992,
  title     = {Proceedings IEEE International Test Conference 1992, Discover
               the New World of Test and Design, Baltimore, Maryland, USA,
               September 20-24, 1992},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1992},
  isbn      = {0-7803-0760-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}