BibTeX record: conf/itc/PatilS92

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@inproceedings{DBLP:conf/itc/PatilS92,
  author    = {Srinivas Patil and
               Jacob Savir},
  title     = {Skewed-Load Transition Test: Part 2, Coverage},
  booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
               New World of Test and Design, Baltimore, Maryland, USA, September
               20-24, 1992},
  pages     = {714--722},
  year      = {1992},
  crossref  = {DBLP:conf/itc/1992},
  url       = {http://dx.doi.org/10.1109/TEST.1992.527893},
  doi       = {10.1109/TEST.1992.527893},
  timestamp = {Wed, 08 Feb 2012 16:28:08 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/PatilS92},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/1992,
  title     = {Proceedings {IEEE} International Test Conference 1992, Discover the
               New World of Test and Design, Baltimore, Maryland, USA, September
               20-24, 1992},
  publisher = {{IEEE} Computer Society},
  year      = {1992},
  isbn      = {0-7803-0760-7},
  timestamp = {Wed, 26 Mar 2003 10:38:32 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/1992},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}