DBLP BibTeX Record 'conf/itc/PaterasS95'

@inproceedings{DBLP:conf/itc/PaterasS95,
  author    = {Stephen Pateras and
               Martin S. Schmookler},
  title     = {Avoiding Unknown States When Scanning Mutually Exclusive
               Latches},
  booktitle = {ITC},
  year      = {1995},
  pages     = {311-318},
  ee        = {http://dx.doi.org/10.1109/TEST.1995.529855},
  crossref  = {DBLP:conf/itc/1995},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1995,
  title     = {Proceedings IEEE International Test Conference 1995, Driving
               Down the Cost of Test, Washington, DC, USA, October 21-25,
               1995},
  publisher = {IEEE Computer Society},
  year      = {1995},
  isbn      = {0-7803-2992-9},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}