BibTeX record: conf/itc/PaterasS95

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@inproceedings{DBLP:conf/itc/PaterasS95,
  author    = {Stephen Pateras and
               Martin S. Schmookler},
  title     = {Avoiding Unknown States When Scanning Mutually Exclusive Latches},
  booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
               the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages     = {311--318},
  year      = {1995},
  crossref  = {DBLP:conf/itc/1995},
  url       = {http://dx.doi.org/10.1109/TEST.1995.529855},
  doi       = {10.1109/TEST.1995.529855},
  timestamp = {Wed, 08 Feb 2012 16:28:09 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/PaterasS95},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/1995,
  title     = {Proceedings {IEEE} International Test Conference 1995, Driving Down
               the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  publisher = {{IEEE} Computer Society},
  year      = {1995},
  isbn      = {0-7803-2992-9},
  timestamp = {Wed, 26 Mar 2003 10:38:41 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/1995},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}