BibTeX record conf/itc/PandeyGLNSC19

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@inproceedings{DBLP:conf/itc/PandeyGLNSC19,
  author       = {Sujay Pandey and
                  Sanya Gupta and
                  Madhu Sudhan L. and
                  Suriya Natarajan and
                  Arani Sinha and
                  Abhijit Chatterjee},
  title        = {Characterization of Library Cells for Open-circuit Defect Exposure:
                  {A} Systematic Methodology},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000154},
  doi          = {10.1109/ITC44170.2019.9000154},
  timestamp    = {Mon, 24 Feb 2020 17:28:46 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/PandeyGLNSC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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