A Pursuit of Superior Cost-Per-Performance in General-Purpose Linear IC Test System.

Yasutoshi Otani Eiji Ishiwa Nobuo Arai Yoshio Yamanaka A Pursuit of Superior Cost-Per-Performance in General-Purpose Linear IC Test System. 105-110 1982 conf/itc/1982 ITC db/conf/itc/itc1982.html#OtaniIAY82