BibTeX record conf/itc/OnoY91

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@inproceedings{DBLP:conf/itc/OnoY91,
  author       = {Toshinobu Ono and
                  Masaaki Yoshida},
  title        = {A Test Generation Method for Sequential Circuits Based on Maximum
                  Utilization of Internal States},
  booktitle    = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
                  Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages        = {75--82},
  publisher    = {{IEEE} Computer Society},
  year         = {1991},
  url          = {https://doi.org/10.1109/TEST.1991.519496},
  doi          = {10.1109/TEST.1991.519496},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/OnoY91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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