BibTeX record conf/itc/OmuroSKO19

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@inproceedings{DBLP:conf/itc/OmuroSKO19,
  author       = {Toshiyuki Omuro and
                  Shigeo Nakamura Surname and
                  Takashi Kimura and
                  Kiyokawa Omuro},
  title        = {A New Test Method for the Large Current Magnetic Sensors},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000142},
  doi          = {10.1109/ITC44170.2019.9000142},
  timestamp    = {Mon, 24 Feb 2020 17:28:46 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/OmuroSKO19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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