BibTeX record conf/itc/OlbrichPGRF96

• > Home > conf/itc/OlbrichPGRF96

@inproceedings{DBLP:conf/itc/OlbrichPGRF96,
  author       = {Thomas Olbrich and
                  Jordi P{\'{e}}rez and
                  Ian Andrew Grout and
                  Andrew Mark David Richardson and
                  Carles Ferrer},
  title        = {Defect-Oriented vs. Schematic-Level Based Fault Simulation for Mixed-Signal
                  ICs},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {511--520},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.557076},
  doi          = {10.1109/TEST.1996.557076},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/OlbrichPGRF96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}