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BibTeX record conf/itc/OkudaKW98
@inproceedings{DBLP:conf/itc/OkudaKW98, author = {Yukio Okuda and Isao Kubota and Masahiro Watanabe}, title = {Defect level prediction for I{\_}DDQ testing}, booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington, DC, USA, October 18-22, 1998}, pages = {900--909}, publisher = {{IEEE} Computer Society}, year = {1998}, url = {https://doi.org/10.1109/TEST.1998.743281}, doi = {10.1109/TEST.1998.743281}, timestamp = {Thu, 23 Mar 2023 23:58:38 +0100}, biburl = {https://dblp.org/rec/conf/itc/OkudaKW98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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