BibTeX record conf/itc/OhHGLJ20

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@inproceedings{DBLP:conf/itc/OhHGLJ20,
  author       = {Youngsu Oh and
                  Dongmin Han and
                  Byeongseon Go and
                  Seungtaek Lee and
                  Woosik Jeong},
  title        = {Novel Eye Diagram Estimation Technique to Assess Signal Integrity
                  in High-Speed Memory Test},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325279},
  doi          = {10.1109/ITC44778.2020.9325279},
  timestamp    = {Mon, 25 Jan 2021 09:58:51 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/OhHGLJ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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