BibTeX record: conf/itc/NorrgardP08

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@inproceedings{DBLP:conf/itc/NorrgardP08,
  author    = {Dayton Norrgard and
               Kenneth P. Parker},
  title     = {Augmenting Boundary-Scan Tests for Enhanced Defect Coverage.},
  booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
               California, USA, October 26-31, 2008},
  year      = {2008},
  pages     = {1--8},
  crossref  = {DBLP:conf/itc/2008},
  url       = {http://dx.doi.org/10.1109/TEST.2008.4700580},
  doi       = {10.1109/TEST.2008.4700580},
  timestamp = {Tue, 02 Sep 2014 23:20:48 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/NorrgardP08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/2008,
  editor    = {Douglas Young and
               Nur A. Touba},
  title     = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
               California, USA, October 26-31, 2008},
  year      = {2008},
  publisher = {{IEEE}},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4690905},
  isbn      = {978-1-4244-2403-0},
  timestamp = {Tue, 02 Sep 2014 23:20:48 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/2008},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}