BibTeX record conf/itc/NoiaPCL12

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@inproceedings{DBLP:conf/itc/NoiaPCL12,
  author       = {Brandon Noia and
                  Shreepad Panth and
                  Krishnendu Chakrabarty and
                  Sung Kyu Lim},
  title        = {Scan test of die logic in 3D ICs using {TSV} probing},
  booktitle    = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
                  USA, November 5-8, 2012},
  pages        = {1--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/TEST.2012.6401568},
  doi          = {10.1109/TEST.2012.6401568},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/NoiaPCL12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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