BibTeX record conf/itc/NishimuraHHOFH86

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@inproceedings{DBLP:conf/itc/NishimuraHHOFH86,
  author       = {Y. Nishimura and
                  Mitsuhiro Hamada and
                  Hideto Hidaka and
                  Hideyuki Ozaki and
                  Kazuyasu Fujishima and
                  Y. Hayasaka},
  title        = {Redundancy Test for 1 Mbit {DRAM} Using Multi-Bit-Test Mode},
  booktitle    = {Proceedings International Test Conference 1986, Washington, D.C.,
                  USA, September 1986},
  pages        = {826--829},
  publisher    = {{IEEE} Computer Society},
  year         = {1986},
  timestamp    = {Fri, 08 Apr 2022 11:01:25 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/NishimuraHHOFH86.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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