Tackling test trade-offs for BIST RTL data paths: BIST area overhead, test application time and power dissipation.

Nicola Nicolici Bashir M. Al-Hashimi Tackling test trade-offs for BIST RTL data paths: BIST area overhead, test application time and power dissipation. 72-81 2001 conf/itc/2001 ITC db/conf/itc/itc2001.html#NicoliciA01