NeedhamPH98'

BibTeX

@inproceedings{DBLP:conf/itc/NeedhamPH98,
  author    = {Wayne M. Needham and
               Cheryl Prunty and
               Yeoh Eng Hong},
  title     = {High volume microprocessor test escapes, an analysis of
               defects our tests are missing},
  booktitle = {ITC},
  year      = {1998},
  pages     = {25-34},
  ee        = {http://www.computer.org/proceedings/itc/5093/50930025abs.htm},
  crossref  = {DBLP:conf/itc/1998},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1998,
  title     = {Proceedings IEEE International Test Conference 1998, Washington,
               DC, USA, October 18-22, 1998},
  publisher = {IEEE Computer Society},
  year      = {1998},
  isbn      = {0-7803-5093-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}