BibTeX record conf/itc/NatarajanSDW07

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@inproceedings{DBLP:conf/itc/NatarajanSDW07,
  author       = {Udaya Shankar Natarajan and
                  Hemalatha Shanmugasundaram and
                  Prachi Deshpande and
                  Chin Soon Wah},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Rapid {UHF} {RFID} silicon debug and production testing},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437593},
  doi          = {10.1109/TEST.2007.4437593},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/NatarajanSDW07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}