@inproceedings{DBLP:conf/itc/NarayananNB92,
author = {Sridhar Narayanan and
Charles Njinda and
Melvin A. Breuer},
title = {Optimal Sequencing of Scan Registers},
booktitle = {ITC},
year = {1992},
pages = {293-302},
ee = {http://dx.doi.org/10.1109/TEST.1992.527836},
crossref = {DBLP:conf/itc/1992},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1992,
title = {Proceedings IEEE International Test Conference 1992, Discover
the New World of Test and Design, Baltimore, Maryland, USA,
September 20-24, 1992},
booktitle = {ITC},
publisher = {IEEE Computer Society},
year = {1992},
isbn = {0-7803-0760-7},
bibsource = {DBLP, http://dblp.uni-trier.de}
}