Michinobu Nakao Seiji Kobayashi Kazumi Hatayama Kazuhiko Iijima Seiji Terada Low overhead test point insertion for scan-based BIST. 348-357 1999 conf/itc/1999 ITC db/conf/itc/itc1999.html#NakaoKHIT99 http://doi.ieeecomputersociety.org/10.1109/TEST.1999.805649