DBLP Record 'conf/itc/NakaoKHIT99'

BibTeX

@inproceedings{DBLP:conf/itc/NakaoKHIT99,
  author    = {Michinobu Nakao and
               Seiji Kobayashi and
               Kazumi Hatayama and
               Kazuhiko Iijima and
               Seiji Terada},
  title     = {Low overhead test point insertion for scan-based BIST},
  booktitle = {ITC},
  year      = {1999},
  pages     = {348-357},
  crossref  = {DBLP:conf/itc/1999},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1999,
  title     = {Proceedings IEEE International Test Conference 1999, Atlantic
               City, NJ, USA, 27-30 September 1999},
  publisher = {IEEE Computer Society},
  year      = {1999},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}