BibTeX record conf/itc/NairBTTGHZ18

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@inproceedings{DBLP:conf/itc/NairBTTGHZ18,
  author       = {Sarath Mohanachandran Nair and
                  Rajendra Bishnoi and
                  Mehdi Baradaran Tahoori and
                  Grigor Tshagharyan and
                  Hayk T. Grigoryan and
                  Gurgen Harutyunyan and
                  Yervant Zorian},
  title        = {Defect injection, Fault Modeling and Test Algorithm Generation Methodology
                  for {STT-MRAM}},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
                  October 29 - Nov. 1, 2018},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/TEST.2018.8624725},
  doi          = {10.1109/TEST.2018.8624725},
  timestamp    = {Tue, 31 Aug 2021 17:59:19 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/NairBTTGHZ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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