NaguraMSFFOKOTDAKT01'

@inproceedings{DBLP:conf/itc/NaguraMSFFOKOTDAKT01,
  author    = {Yoshihiro Nagura and
               Michael Mullins and
               Anthony Sauvageau and
               Yoshinoro Fujiwara and
               Katsuya Furue and
               Ryuji Ohmura and
               Tatsunori Komoike and
               Takenori Okitaka and
               Tetsushi Tanizaki and
               Katsumi Dosaka and
               Kazutami Arimoto and
               Yukiyoshi Koda and
               Tetsuo Tada},
  title     = {Test cost reduction by at-speed BISR for embedded DRAMs},
  booktitle = {ITC},
  year      = {2001},
  pages     = {182-187},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.2001.966632},
  crossref  = {DBLP:conf/itc/2001},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2001,
  title     = {Proceedings IEEE International Test Conference 2001, Baltimore,
               MD, USA, 30 October - 1 November 2001},
  publisher = {IEEE Computer Society},
  year      = {2001},
  isbn      = {0-7803-7169-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}