BibTeX record conf/itc/Nadeau-DostieR20

download as .bib file

@inproceedings{DBLP:conf/itc/Nadeau-DostieR20,
  author       = {Benoit Nadeau{-}Dostie and
                  Luc Romain},
  title        = {Memory repair logic sharing techniques and their impact on yield},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325280},
  doi          = {10.1109/ITC44778.2020.9325280},
  timestamp    = {Mon, 25 Jan 2021 09:58:51 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Nadeau-DostieR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.