MurakamiKSPR00'

@inproceedings{DBLP:conf/itc/MurakamiKSPR00,
  author    = {Atsushi Murakami and
               Seiji Kajihara and
               Tsutomu Sasao and
               Irith Pomeranz and
               Sudhakar M. Reddy},
  title     = {Selection of potentially testable path delay faults for
               test generation},
  booktitle = {ITC},
  year      = {2000},
  pages     = {376-384},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894227},
  crossref  = {DBLP:conf/itc/2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2000,
  title     = {Proceedings IEEE International Test Conference 2000, Atlantic
               City, NJ, USA, October 2000},
  publisher = {IEEE Computer Society},
  year      = {2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}