@inproceedings{DBLP:conf/itc/MooreSCFPRFBRFS07,
author = {Brian Moore and
Chris Sellathamby and
Philippe Cauvet and
H{\'e}rv{\'e} Fleury and
M. Paulson and
Md. Mahbub Reja and
Lin Fu and
Brenda Bai and
Edwin Walter Reid and
Igor M. Filanovsky and
Steven Slupsky},
title = {High throughput non-contact SiP testing},
booktitle = {ITC},
year = {2007},
pages = {1-10},
ee = {http://dx.doi.org/10.1109/TEST.2007.4437595},
crossref = {DBLP:conf/itc/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/2007,
editor = {Jill Sibert and
Janusz Rajski},
title = {2007 IEEE International Test Conference, ITC 2007, Santa
Clara, California, USA, October 21-26, 2007},
booktitle = {ITC},
publisher = {IEEE},
year = {2007},
isbn = {1-4244-1128-9},
ee = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4437545},
bibsource = {DBLP, http://dblp.uni-trier.de}
}