DBLP Record 'conf/itc/MooreGBL00'

BibTeX

@inproceedings{DBLP:conf/itc/MooreGBL00,
  author    = {Will Moore and
               Guido Gronthoud and
               Keith Baker and
               Maurice Lousberg},
  title     = {Delay-fault testing and defects in deep sub-micron ICs-does
               critical resistance really mean anything?},
  booktitle = {ITC},
  year      = {2000},
  pages     = {95-104},
  crossref  = {DBLP:conf/itc/2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2000,
  title     = {Proceedings IEEE International Test Conference 2000, Atlantic
               City, NJ, USA, October 2000},
  publisher = {IEEE Computer Society},
  year      = {2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}