BibTeX record conf/itc/MohanramT03

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@inproceedings{DBLP:conf/itc/MohanramT03,
  author       = {Kartik Mohanram and
                  Nur A. Touba},
  title        = {Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic
                  Circuits},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {893--901},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1271075},
  doi          = {10.1109/TEST.2003.1271075},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MohanramT03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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